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課程名稱 |
離子與探針分析技術
Analytical Techniques with Ions and Probes |
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開課學期 |
109-2 |
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授課對象 |
工學院 材料科學與工程學研究所 |
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授課教師 |
薛景中 |
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課號 |
MSE5059 |
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課程識別碼 |
527 U0400 |
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班次 |
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學分 |
3.0 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期二7,8,9(14:20~17:20) |
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上課地點 |
綜505 |
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備註 |
總人數上限：25人
外系人數限制：5人 |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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課程概述 |
Surface chemical composition and atomic arrangement is key to material properties. In this course, techniques based on ion-solid and probe-solid interactions will be covered. For each technique, theoretical background, technical construction, experimental parameters and data interpretation will be discussed. |
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課程目標 |
Applications and selection criteria will be emphasized for selecting appropriate technique to obtain required information then present and discuss the meaning of results correctly. |
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課程要求 |
General Chemistry; General Physics; Physical Chemistry |
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預期每週課後學習時數 |
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Office Hours |
另約時間 |
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指定閱讀 |
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參考書目 |
T.L Alford, L.C. Feldman and J.W. Mayer, Fundamentals of Nanoscale Film Analysis, 2007, Springer. DOI: 10.1007/978-0-387-29261-8
J.C. Vickerman and I.S. Gillmore, Surface Analysis – The Principal Techniques, 2nd ed., 2009, John Wiley & Sons. DOI: 10.1002/9780470721582
J.C. Rivière and S. Myhra, Handbook of Surface and Interface Analysis: Methods for Problem-Solving, 2nd ed., 2009, CRC Press. ISBN: 978-0-8493-7558-3
F. Ernst and M. Rühle, High-Resolution Imaging and Spectrometry of Materials, 2003, Springer. DOI: 10.1007/978-3-662-07766-5
J. O’Connor, B.A. Sexton, R.St.C. Smart, Surface Analysis Methods in Materials Science, 2003, Springer. DOI: 10.1007/978-3-662-05227-3
D.P. Woodruff, T.A. Delchar, Modern Techniques of Surface Science, 2nd ed., 1994, Cambridge. DOI: 10.1017/CBO9780511623172 |
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評量方式
(僅供參考) |
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No. |
項目 |
百分比 |
說明 |
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1. |
final exam |
30% |
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2. |
mid-term exam |
30% |
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3. |
homework |
40% |
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